Tính năng

1. Hình ảnh SEM có thể được quan sát cùng với hình ảnh quang học

2. Hình ảnh được nhìn thấy rõ hơn nhờ súng điện tử có độ phân giải cao

Chức năng mới

Chức năng quan sát tự động: Simple SEM/EDS

Simple SEM function enables automatic measurements by registering multiple conditions at once. Simple
This improves the efficiency of routine work.

Live 3D: constructs 3D image on the spot

Imaging is possible at a low magnification with a little distortion, due to the out-lens objective lens.

Live 3D image

New Low Vacuum Hybrid Secondary Electron Detector (LHSE) ※Optional function

The LHSED, a new low-vacuum detector, enables observation while switching between images containing light emission information and topographic images.

LHSED Features

• Improved quality of low vacuum secondary electron live image
• Acquisition of light emission information
• Switching between topographic and light emission information image

Schottky FE electron gun stability has been enhanced more than 4 times compared to the previous models

Automatic Beam Adjustment

JSM-IT710HR does not require complicated manual adjustment and provides automatic adjustment from axis alignment to astigmatism correction and focusing.

Secondary Electron Detection System

Secondary electron detector (SED)

\

Low vacuum secondary electron detector (LVSED/LHSED)

Both High Resolution and Large Current

The Schottky field emission gun used in the JSM-IT710HR enables high-resolution observation and analysis because the electron gun is integrated with the condenser lens to create large currents while maintaining a small probe.

Backscattered Electron Detection System

The new multi-segmented backscattered electron detector acquires backscattered electron images from four directions at once so that a simple 3D image can be created and displayed live, in real-time.

Every Analysis Starts with Zeromag　

Zeromag's optical image simplifies navigation.
SEM images can be linked to optical images for easy observation, analysis, and automated measurements.

EDS Integration

JEOL manufactures and sells not only SEMs but also EDS.
Fully embedded EDS with SEM for simplified workflow, operation and data management.

Phase Analysis

JEOL’s EDS system supports a new phase analysis function. Phase maps can be created from map data set.

Backscattered electron image

Phase mapping (Overlay of multiple phases)

Specimen: cross section of a cutting tool for precision machining

Phase analysis indicates component difference between Co, Cu and Sn rich area