Nhiễu xạ tia X, XRD, Bruker, D8 Discover

Hệ thống quang phổ XRD nghiên cứu chuyên sâu

Hệ thống quang phổ XRD nghiên cứu chuyên sâu
Model: D8 DISCOVER
Hãng sản xuất : BRUKER AXS
Xuất xứ : Đức
Lượt xem : 2421
Mô tả:
The D8 DISCOVER is the flagship multi-purpose X-ray diffractometer offering leading technology components. It is designed for the structural characterization of the full range of materials from powders, amorphous and polycrystalline materials to epitaxial multi-layered thin films at ambient and non-ambient conditions.

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D8 DISCOVER FEATURES

Microfocus Source IµS

The IµS microfocus source equipped with MONTEL optics provides a small high intensity x-ray beam that is perfectly suited for the investigation of small areas or samples.

Millimeter sized beam with high brilliance and ultra-low background
Green design with low power consumption, no water consumption and extended life components
MONTEL optics to optimize the beam shape and divergence
Full compatibility with our large choice of components, optics and detectors

UMC Sample stages

The D8 DISCOVER offers a multitude of UMC stages with unrivalled mapping and weight capacity:

Mapping of samples with a weight of up to 5 kg
Large area mapping of samples with up to 300 mm size.
UMC stages for High-Throughput Screening (HTS) with support of up to three well-plates.

Due to the high modularity the UMC stages can be customized to match customer requirements that go beyond the standard configurations.

Multimode EIGER2 R Detectors

The EIGER2 R 250K and 500K are the 2D detectors that bring Synchrotron performance to laboratory X-Ray Diffraction

Advanced Sensor Design including the 2nd generation of the revolutionary EIGER: up to 500.000 pixels with size of 75 x 75 mm² allow for Macroscopic Coverage with Microscopic Resolution.
Its ergonomic design allows to adapt detector position and orientation with least effort to the application requirements. This includes toolless switch between 0°/90° orientation and a continuously variable detector position with automated calibration.
Panoramic Optics and Accessories for unobstructed field of view.
0D, 1D and 2D operation mode with Snap-Shot, Step, Continuous or Advanced Scanning modes.
Complete and seamless integration into the DIFFRAC.SUITE.

TRIO and PATHFINDER PLUS Optics

The patented TRIO optics enables automated switching between three beampaths:

Focusing Bragg-Brentano for powders
High intensity parallel beam Kα1,2 for capillary, GID and XRR
High-resolution parallel-beam Kα1 geometry for epitaxial thin films

The PATHFINDER^Plus optic includes an automated absorber to ensure linearity of the measured intensities and allows to switch between:

Motorized slit for high flux measurements
Analyzer crystal for high resolution measurements

Equipped with TRIO and PATHFINDER^Plus the D8 DISCOVER masters all sample types including powder, bulk, fiber, sheet and thin-film (amorphous, polycrystalline and epitaxial) under ambient or non-ambient conditions without any need of reconfiguration.

SNAP-LOCK

SNAP-LOCK

D8 DISCOVER Specifications

Specification

Benefit

TWIST-TUBE

Easy switch between point and line focus

Available anodes: Cr, Cu, Mo, Ag

Max. Power and filament: up to 3 kW depending on anode material (0,4 x 16 mm² )

Patent: EP 1 923 900 B1

Quick change of the wavelength to perfectly match different applications

Fastest switch between line and point focus for a wider range of applications and better results in shorter time

IµS Microfocus Source

Power load: up to 50 W, single-phase power

MONTEL and MONTEL Plus optics combining parallel and focusing mirrors.

Beam sizes down to 180 x 180 µm².

Maximum integrated flux 8 x 10⁸ cps at mirror exit.

Beam divergence down to 0,5 mrad

Millimeter sized beam with high brilliance and ultra-low background

Green design with low power consumption, no water consumption and extended life components

Optimize the beam shape and divergence for best results

Turbo X-Ray Source (TXS)

Line focus, 0.3x3 mm²

Focal brigthness of 6 kW/mm²

Anode materials: Cu, Co, Cr, Mo

Max. voltage 50 kV, max. power depending on anode material: Cr 3.2 kW, Cu/Mo 5.4 kW, Co 2,8 kW

Pre-Aligned Tungsten filament

Up to 5 times more intensity compared to standard ceramic X-ray sources.

Perfectly suited for line and spot focus applications

Pre-Aligned filament allow fast filament exchange with a minimum of re-alignment requirement.

TRIO Optics

Software push-button switch between:

Motorized Divergence Slit (Bragg-Brentano)

High Intensity Ka1,2 Parallel Beam

High Resolution Ka1 Parallel Beam

Patents: US10429326, US6665372, US7983389

Fully automatic, motorized switching between up to 6 different beam geometries without any manual user intervention

Perfectly suited for all sample types including powders, bulk materials, fibers, sheets and thin-films (amorphous, polycrystalline and epitaxial)

High-Resolution Monochromators

Ge(220) and Ge(004) reflections in symmetric and asymmetric geometry

2-bounce and 4-bounce (Bartels type) monochromators

Alignment-free mounting through SNAP.LOCK technology

Broad choice for best resolution vs. intensity balancing to obtain best possible results.

Fast exchange of monochromators to optimize to different samples

D8 Goniometer

Two-circle goniometer with independent stepper motors and optical encoders

Unparalleled accuracy and precision as manifasted by Bruker's unique alignment guarantee

Absolutely maintenance free drive mechanism / gearings with lifetime lubrication

UMC Stages

Family of sample stages

x,y for sample translation of up to +/- 150 mm

z-Drive with travel of up to 50 mm

Phi drive with infinite rotation

Max. Psi inclination up to 55°

Max. weight (at center position) : 50 kg

Unrivalled capacity in sample weight and size

Enables the implementation of large custom-made sample chambers

Centric Eulerian Cradle (CEC)

Five degrees of freedom sample stage:

x,y for sample translation of +/-40 mm

z-Drive for height alignment

Phi drive with 360° rotation

Psi drive and angular range from -11° to 98°

Max. weight load: 1 kg

Various stage attachment avaible.

Stress and Texture measurements in side-inclination for higher accuracy results.

Automated mapping capability in (x,y).

Motorized tilt-stage for precise surface alignment.

Powder- or capillary spinners allow for powder diffraction.

Bayonette sample stage holder for fast and reproducible swapping with other stages.

Pathfinder Plus Optics

Software push-button switch between:

Motorized Slit

2-bounce Ge Analyzer

Automated absorber integrated

Fully automatic, motorized switching between two different optics without any manual user intervention.

Maintains full field of view of LYNXEYE detectors.

Absorber ensures linearity in measured data

LYNXEYE XE-T

Energy Resolution: < 380 eV @ 8 KeV

Detection Modes: 0D,1D, 2D

Wavelengths: Cr, Co, Cu, Mo and Ag

Patents: EP1647840, EP1510811, US20200033275

No need for Kß filters and secondary monochromators

100% filtering of Fe-fluorescense with Cu radiation

Up to 450 times faster than conventional detector systems

Bragg2D: Collect 2D data with a divergent primary line beam

Unique detector warranty: No defective channels at delivery time

EIGER2

The latest generation multi-mode (0D/1D/2D) detector based on the Hybrid Photon Counting technology, developed by Dectris Ltd.

Seamless integration of 0D, 1D and 2D detection in step, continuous and advanced scanning modes

Ergonomic, alignment-free detector rotation to optimize γ or 2Θ angular coverage

Panoramic, tool-free diffracted beam optics using the complete detector field of view

Continuously variable detector positioning to balance angular coverage and resolution

Non-ambient

Temperature: Ranging from ~12 K up to ~2500 K

Pressure: 10-⁴ mbar up to 100 bar

Humidity: 5% to 95% RH

Investigations under ambient and non-ambient conditions

Easily exchanged stages with DIFFRAC.DAVINCI

The D8 DISCOVER is the flagship multi-purpose X-ray diffractometer offering leading technology components. It is designed for the structural characterization of the full range of materials from powders, amorphous and polycrystalline materials to epitaxial multi-layered thin films at ambient and non-ambient conditions.

Applications:

Phase Identification and quantification, structure determination and refinement, Micro strain and crystallite size analysis,
X-Ray reflectometry, Grazing Incidence Diffraction (GID), In-Plane Diffraction, High-resolution XRD, GISAXS, GI-Stress analysis, crystal orientation analysis
Residual Stress analysis, Texture and pole figures, micro X-ray Diffraction, Wide Angle X-ray Scattering (WAXS),
Total scattering analysis: Bragg Diffraction, Pair-Distribution Function (PDF), Small Angle X-Ray Scattering (SAXS)

D8 DISCOVER APPLICATIONS

Thin Film Analysis

X-Ray Diffraction (XRD) and reflection play a dominant role in the non-destructive characterization of thin layer structured samples. The D8 DISCOVER and DIFFRAC.SUITE software support simple execution of common XRD methods in thin film analysis:

Grazing Incidence Diffraction (GID) for Surface sensitive Identification of crystalline phases and determination of their structural properties including crystallite size and strain.
X-ray reflectometry (XRR) for the extraction of thicknesses, material densities and interface structures in multi-layer samples – from simple substrates to highly complex superlattice structures.
High-resolution X-Ray Diffraction (HRXRD) for the analysis of epitaxial grown sample structures: Layer thickness, Strain, relaxation, mosaicity, composition analysis of mixed crystals.
Stress and Texture (preferred orientation) analysis

Materials Research

XRD is one of the most important tools in materials research as it allows linking of structural and physical properties of materials. The D8 DISCOVER is the flagship XRD instrument for materials research. Equipped with leading technology components the D8 DISCOVER delivers top performance and full flexibility and enables researchers for a detailed characterization of their materials:

Phase Identification and structure determination
Micron strain and crystallite size analysis
Stress and Texture analysis
Determination of Particle size and distribution.
Local XRD analysis using µm sized X-ray beams
Reciprocal Space Mapping

Screening and Large Area Mapping

The D8 DISCOVER is the ultimate solution when it comes to High-Throughput Screening (HTS) and the mapping of large areas on samples. The UMC sample stages deliver a range of motion that puts the D8 DISCOVER in a class of its own in both motorized translation and weight capacity:

Hight Throughput Screening (HTS) of well plate and deposited samples in both reflection and transmission
Mapping of samples with a size of up to 300 mm
Mounting and mapping samples with weights up to 5 kg
Automation interfacing

Residual Stress Analysis

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