|
Specification |
Benefit |
TWIST-TUBE |
Easy switch between point and line focus
Available anodes: Cr, Cu, Mo, Ag
Max. Power and filament: up to 3 kW (0,4 x 16 mm²), depending on anode material
Patent: EP 1 923 900 B1
|
Quick change of the wavelength to perfectly match different applications
Fastest switch between line and point focus for a wider range of applications and better results in shorter time
|
Iµs Microfocus Source |
Power load: up to 50 W, single-phase power
MONTEL and MONTEL Plus optics combining parallel and focusing mirrors.
Beam sizes down to 180 x 180 µm².
Maximum integrated flux 8 x 10⁸ cps at mirror exit.
Beam divergence down to 0,5 mrad
|
Millimeter sized beam with high brilliance and ultra-low background
Green design with low power consumption, no water consumption and extended life components
Optimize the beam shape and divergence for best results
|
TXS-HE X-Ray Source |
Compact and light design for vertical ATLAS goniometer
Line focus, 0.3x3 mm²
Focal Brigthness of 6 kW/mm²
Anode materials: Cu, Co, Cr, Mo
Max. voltage 50 kV, max. power depending on anode material: Cr 3.2 kW, Cu/Mo 5.4 kW, Co 2,8 kW
Pre-Aligned Tungsten filament
|
High flux X-ray source that allows for horizontal sample mounting.
Up to 5 times more intensity compared to standard ceramic X-ray sources.
Perfectly suited for line and spot focus applications
Pre-Aligned filament allow fast filament exchange with a minimum of re-alignment requirement.
|
TRIO Optics |
Software push-button switch between:
Motorized Divergence Slit (Bragg-Brentano)
High Intensity Ka1,2 Parallel Beam
High Resolution Ka1 Parallel Beam
Patents: US10429326, US6665372, US7983389
|
Fully automatic, motorized switching between up to 6 different beam geometries without any manual user intervention
Perfectly suited for all sample types including powders, bulk materials, fibers, sheets and thin-films (amorphous, polycrystalline and epitaxial)
|
High-Resolution Monochromators |
Ge(220) and Ge(004) reflections in symmetric and asymmetric geometry
2-bounce and 4-bounce (Bartels type) monochromators
Alignment-free mounting through SNAP.LOCK technology
|
Broad choice for best resolution vs. intensity balancing to obtain best possible results.
Fast exchange of monochromators to optimize to different samples
|
ATLAS™ Goniometer |
Vertical goniometer with enforced mechanics designed to host TXS-HE X-ray source
Industry leading angular accuracy : ±0.007° 2θ guaranteed over the entire angular range determined on NIST SRM 1976
Seamless integration of D8 family of components, including optics, positioning cameras, sample stage, nonambient and detector technologies
|
Unparalleled accuracy and precision as manifested by Bruker's unique alignment guarantee
Absolutely maintenance free drive mechanism / gearings with lifetime lubrication
Supports the full range of applications to generate highest accuracy data
|
Non-Coplanar Arm |
Third goniometer axis for investigating ultra-thin layers and in-plane sample properties:
Min. step size: 0.001°
Max. 2θ range (depending on the configuration): 160°
Automated detector distance detection
|
Unmatched accuracy with direct angular encoder
Seamless integration in DIFFRAC.SUITE software
Up to 160° 2θ range for most accurate Non-Coplanar structure determination
Real-time calibration for EIGER2 detector
|
Compact UMC Stages |
Compact UMC Plus 80:
Fast spinner for XRPD
Max. (x,y) translation: +/- 40 mm
Max. sample height: 57 mm
Compact UMC Plus 150:
Max. (x,y) translation: +/- 75 mm
Max. sample height: 57 mm
Vacuum and electric feedthroughs for wafer chuck and tilt stages
|
Seamless switching between Thin Film research and Powder diffraction mode
5 position sample changer for 51 mm sample diameter
9 position sample changer for 32 mm sample diameter
Mapping of 2-4” wafers
Mapping of 6-8” wafers
Reflection mode 96 well plate capability
Allows for infinite Phi rotation with connected Tilt-stage and vacuum without a need to care for cables or vacuum pipe.
|
Centric Eulerian Cradle (CEC) |
Five degrees of freedom sample stage:
x,y for sample translation of +/-40 mm
z-Drive for height alignment
Phi drive with 360° rotation freedom.
Psi drive and angular range from -11° to 98°
Max. weight load: 1 kg
Various stage attachment available.
|
Stress and Texture measurements in side-inclination mode for more accurate results.
Automated mapping capability in (x,y).
Motorized tilt-stage for precise surface alignment.
Powder- or capillary spinners allow for powder diffraction.
Bayonet sample stage holder for fast and reproducible swapping with other stages.
|
Pathfinder Plus Optics |
Software push-button switch between:
Motorized Slit
2-bounce Ge Analyzer
Automated absorber integrated
|
Fully automatic, motorized switching between two different optics without any manual user intervention.
Maintains full field of view of LYNXEYE detectors.
Absorber ensures linearity in measured data
|
LYNXEYE XE-T |
Energy Resolution: < 380 eV @ 8 KeV
Detection Modes: 0D,1D, 2D
Wavelengths: Cr, Co, Cu, Mo and Ag
Patents: EP1647840, EP1510811, US20200033275
|
No need for Kß filters and secondary monochromators
100% filtering of Fe-fluorescense with Cu radiation
Up to 450 times faster than conventional detector systems
Bragg2D: Collect 2D data with a divergent primary line beam
Unique detector warranty: No defective channels at delivery time
|
EIGER2 |
The latest generation multi-mode (0D/1D/2D) detector based on the Hybrid Photon Counting technology, developed by Dectris Ltd. |
Seamless integration of 0D, 1D and 2D detection in step, continuous and advanced scanning modes
Ergonomic, alignment-free detector rotation to optimize γ or 2Θ angular coverage
Panoramic, tool-free diffracted beam optics using the complete detector field of view
Continuously variable detector positioning to balance angular coverage and resolution
|
Non-ambient |
Temperature: Ranging from ~12 K up to ~2500 K
Pressure: 10-⁴ mbar up to 100 bar
Humidity: 5% to 95% RH
|
Investigations under ambient and non-ambient conditions
Easily exchanged stages with DIFFRAC.DAVINCI
|