Kính hiển vi nguyên tử lực FX40 / PARK SYSTEMS
Built-in robotics and a machine-learning algorithm detect and warn you about incorrectly placed probes, since you can use either the automatic or manual tip loading feature. Access various error status report during probe loading to make sure you have the highest degree of accuracy.
SmartScan displays and stores measurements from sensors, which measure essential environmental conditions such as temperature, humidity, leveling and vibration. This allows you to compare your scanned images with different environmental channels, providing further environmental indicators for system diagnosis.
Safety Probe Pickup
New tip crash prevention protects the tip and AFM scanner using a combination of software interlock and hardware switch. Through algorithmic programming, the Z stage can’t physically go down any further than the limit of tip collision with the sample surface, allowing you peace of mind for the safety of your sample and AFM.
Environmental Sensors
The True Non-contact mode achieves unprecedented control over tip-sample distance at the sub-nanometer scale.
The Park FX40 has a faster and more accurate True Non-contact mode than any other AFM on the market
Safety probe landing – Maximizing to protect your sample
Park FX40 uses machine learning to automatically detect whether probes are correctly positioned. Smart vision takes it one step further by locating the position of a loaded probe to a nano level and generating error status reports if necessary, instantly comparing this data to tens of thousands of possible simulated issues which are continuously upgraded through software updates.
The Fastest and The Most Accurate, Scanning Mode in Atomic Force Microscopy
Automatic Beam Alignment positions the laser beam onto the proper location of a cantilever and further optimizes the PSPD position both vertically and laterally. It shifts the X,Y and Z axis for clearer images, with no distortion, all autonomously at the click of a button.
The Probe Identification Camera reads the QR code imprinted on the chip carrier of a newly loaded probe and extracts and displays all pertinent information on each of the tips available, including the type, model, application, and usage. This enables you to quickly select the best probe tip for each job.
Auto Beam Alignment
With automated probe exchange, you can now replace old probes easily and safely in full automation. Harnessing the convenience of an 8-probe cassette, along with a magnetic controlled mechanism, the Park FX40 autonomously mounts the probes.
Auto Probe Reading
Park FX40 Specs
XY Scanner
Structure
▪ Single-module, parallel-kinematic 2D flexure scanner
▪ Better symmetry than serial-kinematic flexure scanner
XY scan range
▪ 100 µm x 100 µm
Z Scanner
Structure
▪ Flexure-guided high-force scanner
▪ Better symmetry than serial-kinematic flexure scanner
Z scan range
▪ 15 µm
Sample mount
Mounting
▪ Magnetic holder (Max. 4 sample disc)
▪ FX Snap-in Sample Disk for Multi Snap-in Sample Chuck
Stages
Z stage travel range
▪ 22 mm (Motorized)
Visions and optics
Vision path
▪ On-axis sample view from top
▪ The same view as an optical microscope
CCD
▪ 5.1 M Pixel
▪ Pixel size: 3.45 μm x 3.45 μm
AFM Controller
Lock-in amp
▪ 4 channels integrated DC - 5 MHz
Accessories
Probe exchange
▪ Probe exchange in less than 1 minutes using Automated Probe Exchange
(No need to remove head to exchange cantilevers)
Probe mount
▪ Pre-aligned mount using chip carrier