Kính hiển vi lực nguyên tử (AFM) - XE7/PARK SYSTEMS

Park XE7 Specifications
 
XY Scanner
Single-module flexure XY scanner with closed-loop control
Scan range : 100μm x 100μm
                         50μm x 50μm
                         10μm x 10μm

 Manual Stage
XY travel range : 13 × 13 mm
Z travel range : 29.5 mm
Focus travel range : 70 mm

 Z Scanner range
Guided high-force Z scanner
Scan range : 12 µm
                         15 µm

 Sample Mount
Sample size : Up to 100 mm
Thickness : Up to 20 mm

 Vision
Direct on-axis vision of sample surface and cantilever
Coupled with 10× objective lens (20× optional)
Field-of-view : 480 × 360 µm
CCD : 1 Mpixel

 Software
XEP
Dedicated system control and data acquisition software
Adjusting feedback parameters in real time
Script-level control through external programs (optional)

 XEI
AFM data analysis software

 Electronics
High performance DSP : 600 MHz with 4800 MIPS
Maximum 16 data images
Maximum data size : 4096 × 4096 pixels
Signal inputs : 20 channels of 16 bit ADC at 500 kHz samplings
Signal outputs : 21 channels of 16 bit DAC at 500 kHz settling
Synchronous signal : End-of-image, end-of-line, and end-of-pixel TTL signals
Active Q control (optional)
Cantilever spring constant calibration (optional)
CE Compliant
Power : 120 W
Signal Access Module (Optional)

Park XE7 has the most extensive range of SPM modes (*Optionally available)
Standard Imaging
True Non-Contact AFM
Basic Contact AFM
Lateral Force Microscopy (LFM)
Phase Imaging
Chemical Properties*
Chemical Force Microscopy
Electrochemical Microscopy (EC-AFM)
Force Measurement*
Force Distance (FD) Spectroscopy
Force Volume Imaging
Spring Constant Calibration by Thermal Method
 
Electrical Properties*
Conductive AFM
IV Spectroscopy
Kelvin Probe Force Microscopy (KPFM)
Scanning Capacitance Microscopy (SCM)
Scanning Spreading-Resistance Microscopy (SSRM)
Scanning Tunneling Microscopy (STM)
Scanning Tunneling Spectroscopy (STS)
Time-Resolved Photo Current Mapping (PCM)
Magnetic Properties*
Magnetic Force Microscopy (MFM)
Tunable MFM
 
Dielectric/Piezoelectric Properties*
Electrostatic Force Microscopy (EFM)
Piezoelectric Force Microscopy (PFM)
Mechanical Properties*
Force Modulation Microscopy (FMM)
Nanoindentation
Nanolithography
Thermal Properties*
Scanning Thermal Microscopy (SThM)